TY - GEN
T1 - HBM cross power domain failure due to secondary tester pulse
AU - Jack, Nathan
AU - Davis, James
AU - Chaine, Michael
AU - Rosenbaum, Elyse
PY - 2009
Y1 - 2009
N2 - A cross power domain failure, caused by the secondary pulse produced by HBM testers, is presented. Previous works report damage due to "trailing pulse" EOS, but this failure is caused by the second discharge which occurs when the relay achieves mechanical continuity. ESD paths which are not transiently triggered can protect against this stress.
AB - A cross power domain failure, caused by the secondary pulse produced by HBM testers, is presented. Previous works report damage due to "trailing pulse" EOS, but this failure is caused by the second discharge which occurs when the relay achieves mechanical continuity. ESD paths which are not transiently triggered can protect against this stress.
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UR - http://www.scopus.com/inward/citedby.url?scp=77951001954&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:77951001954
SN - 1585371750
SN - 9781585371754
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009
T2 - Electrical Overstress/Electrostatic Discharge Symposium 2009, EOS/ESD 2009
Y2 - 30 August 2009 through 4 September 2009
ER -