HBM cross power domain failure due to secondary tester pulse

Nathan Jack, James Davis, Michael Chaine, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution


A cross power domain failure, caused by the secondary pulse produced by HBM testers, is presented. Previous works report damage due to "trailing pulse" EOS, but this failure is caused by the second discharge which occurs when the relay achieves mechanical continuity. ESD paths which are not transiently triggered can protect against this stress.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009
StatePublished - 2009
EventElectrical Overstress/Electrostatic Discharge Symposium 2009, EOS/ESD 2009 - Anaheim, CA, United States
Duration: Aug 30 2009Sep 4 2009

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159


OtherElectrical Overstress/Electrostatic Discharge Symposium 2009, EOS/ESD 2009
Country/TerritoryUnited States
CityAnaheim, CA

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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