Hardware and software combined detection of system-level ESD-induced soft failures

Sandeep Vora, Rui Jiang, Prajwal Mysore Vijayaraj, Keven Feng, Yang Xiu, Shobha Vasudevan, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience soft failures. Voltage monitors are used to correlate the occurrence of those failures with the magnitude of noise on power supplies.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PublisherESD Association
ISBN (Electronic)1585373028
StatePublished - Oct 25 2018
Event40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States
Duration: Sep 23 2018Sep 28 2018

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2018-September
ISSN (Print)0739-5159

Other

Other40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
CountryUnited States
CityReno
Period9/23/189/28/18

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Vora, S., Jiang, R., Vijayaraj, P. M., Feng, K., Xiu, Y., Vasudevan, S., & Rosenbaum, E. (2018). Hardware and software combined detection of system-level ESD-induced soft failures. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2018-September). ESD Association.