@inproceedings{0126f4333d5e4541a84c863b651364f2,
title = "Hardware and software combined detection of system-level ESD-induced soft failures",
abstract = "A semi-custom microcontroller is subjected to IEC-61000-4-2 ESD. A scan chain and memory read-out programs enable identification of the hardware blocks that experience soft failures. Voltage monitors are used to correlate the occurrence of those failures with the magnitude of noise on power supplies.",
author = "Sandeep Vora and Rui Jiang and Vijayaraj, {Prajwal Mysore} and Keven Feng and Yang Xiu and Shobha Vasudevan and Elyse Rosenbaum",
note = "Publisher Copyright: {\textcopyright} 2018 ESD Association. All rights reserved.; 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 ; Conference date: 23-09-2018 Through 28-09-2018",
year = "2018",
month = oct,
day = "25",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018",
}