Guilty As Charged: Computational Reliability Threats Posed by Electrostatic Discharge-induced Soft Errors

Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Keyphrases

Computer Science

Engineering

Physics

Mathematics