Growth, patterning, and weak link behavior in high tc thin films

G. C. Hilton; R. A. Schweinfurth; D. J. Van Harlingen

doi:10.1109/20.92440

Growth, patterning, and weak link behavior in high tc thin films

G. C. Hilton
, R. A. Schweinfurth
, D. J. Van Harlingen

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The authors report techniques for making Josephson weak links in thin films of the high-temperature ceramic superconductors. They have fabricated superconducting thin films of YBaCuO and BiSrCaCuO by several methods. These films have been patterned into fine lines and small loops, and a variety of measurements have been performed on these structures. Intrinsic weak link behavior is observed between grains in patterned films and can be modified by an in-situ ion beam milling and measurement procedure.

Original language	English (US)
Pages (from-to)	931-934
Number of pages	4
Journal	IEEE Transactions on Magnetics
Volume	25
Issue number	2
DOIs	https://doi.org/10.1109/20.92440
State	Published - Mar 1989

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/20.92440

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title = "Growth, patterning, and weak link behavior in high tc thin films",

abstract = "The authors report techniques for making Josephson weak links in thin films of the high-temperature ceramic superconductors. They have fabricated superconducting thin films of YBaCuO and BiSrCaCuO by several methods. These films have been patterned into fine lines and small loops, and a variety of measurements have been performed on these structures. Intrinsic weak link behavior is observed between grains in patterned films and can be modified by an in-situ ion beam milling and measurement procedure.",

author = "Hilton, \{G. C.\} and Schweinfurth, \{R. A.\} and \{Van Harlingen\}, \{D. J.\}",

note = "supported by the Materials Research Laboratory program of the National Science Foundation under grant DMRB6-12860. We also acknowledge extensive use of the Microfabrication Laboratory and Center for the Microanalysis of Materials of the University of Illinois Materials Research Laboratory, and the Electron Beam Facility of the Center for Compound Semiconductor Microelectronics at the University of I11 inois.",

year = "1989",

month = mar,

doi = "10.1109/20.92440",

language = "English (US)",

volume = "25",

pages = "931--934",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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T1 - Growth, patterning, and weak link behavior in high tc thin films

AU - Hilton, G. C.

AU - Schweinfurth, R. A.

AU - Van Harlingen, D. J.

N1 - supported by the Materials Research Laboratory program of the National Science Foundation under grant DMRB6-12860. We also acknowledge extensive use of the Microfabrication Laboratory and Center for the Microanalysis of Materials of the University of Illinois Materials Research Laboratory, and the Electron Beam Facility of the Center for Compound Semiconductor Microelectronics at the University of I11 inois.

PY - 1989/3

Y1 - 1989/3

N2 - The authors report techniques for making Josephson weak links in thin films of the high-temperature ceramic superconductors. They have fabricated superconducting thin films of YBaCuO and BiSrCaCuO by several methods. These films have been patterned into fine lines and small loops, and a variety of measurements have been performed on these structures. Intrinsic weak link behavior is observed between grains in patterned films and can be modified by an in-situ ion beam milling and measurement procedure.

AB - The authors report techniques for making Josephson weak links in thin films of the high-temperature ceramic superconductors. They have fabricated superconducting thin films of YBaCuO and BiSrCaCuO by several methods. These films have been patterned into fine lines and small loops, and a variety of measurements have been performed on these structures. Intrinsic weak link behavior is observed between grains in patterned films and can be modified by an in-situ ion beam milling and measurement procedure.

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U2 - 10.1109/20.92440

DO - 10.1109/20.92440

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JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 2

ER -

Growth, patterning, and weak link behavior in high tc thin films

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