@article{4de7925ec38a45f89f26c2d3ce273890,
title = "Growth and properties of heavy fermion CeCu2Ge2 and CeFe2Ge2 thin films",
abstract = "Epitaxial films of heavy fermion CeCu2Ge2 and CeFe2Ge2 are grown on DyScO3 and MgO substrates using molecular beam epitaxy. The growth begins via island nucleation leading to a granular morphology. The grains grow flat with c-axis orientation after nucleating, as indicated by in-situ reflection high energy electron diffraction (RHEED) and ex-situ analysis including atomic force microscopy (AFM) and x-ray diffraction (XRD). These single phase films show similar temperature dependent transport to single crystals of the materials indicating that similar collective order occurs in the films as in single crystals.",
author = "Li, {Yize Stephanie} and Mao Zheng and Brian Mulcahy and Greene, {Laura H.} and Eckstein, {James N.}",
note = "Funding Information: This material is based upon work supported by the Center for Emergent Superconductivity, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award Number DE-AC0298CH1088. AFM and XRD analysis were carried out in the Frederick Seitz Materials Research Laboratory Central Facilities, University of Illinois, which are partially supported by the U.S. Department of Energy under grants DE-FG02-07ER46453 and DE-FG02-07ER46471. We thank Scott MacLaren, Mauro Sardela, and Doug Jeffers for technical support and discussion.",
year = "2011",
month = jul,
day = "25",
doi = "10.1063/1.3610975",
language = "English (US)",
volume = "99",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "4",
}