@inproceedings{9808f553ff2943b3916621265d193118,
title = "GPGPUs: How to combine high computational power with high reliability",
abstract = "GPGPUs are used increasingly in several domains, from gaming to different kinds of computationally intensive applications. In many applications GPGPU reliability is becoming a serious issue, and several research activities are focusing on its evaluation. This paper offers an overview of some major results in the area. First, it shows and analyzes the results of some experiments assessing GPGPU reliability in HPC datacenters. Second, it provides some recent results derived from radiation experiments about the reliability of GPGPUs. Third, it describes the characteristics of an advanced fault-injection environment, allowing effective evaluation of the resiliency of applications running on GPGPUs.",
keywords = "fault injection, GPGPUs, HPC, radiation, reliability",
author = "Gomez, {L. Bautista} and F. Cappello and L. Carro and N. Debardeleben and B. Fang and S. Gurumurthi and K. Pattabiraman and P. Rech and Reorda, {M. Sonza}",
year = "2014",
doi = "10.7873/DATE2014.354",
language = "English (US)",
isbn = "9783981537024",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - Design, Automation and Test in Europe, DATE 2014",
address = "United States",
note = "17th Design, Automation and Test in Europe, DATE 2014 ; Conference date: 24-03-2014 Through 28-03-2014",
}