A method is described which elucidates propagation of an electromagnetic field generated by a stochastic, electromagnetic source within the short wavelength limit. The results can be used to determine statistical properties of fields using ray tracing methods.
|Original language||English (US)|
|Journal||Physical Review A - Atomic, Molecular, and Optical Physics|
|State||Published - Apr 24 2008|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics