Genome-wide association mapping for leaf tip necrosis and pseudo-black chaff in relation to durable rust resistance in wheat

Philomin Juliana, Jessica E. Rutkoski, Jesse A. Poland, Ravi P. Singh, Sivasamy Murugasamy, Senthil Natesan, Hugues Barbier, Mark E. Sorrells

Research output: Contribution to journalArticle

Abstract

The partial rust resistance genes Lr34 and Sr2 have been used extensively in wheat (Triticum aestivum L.) improvement, as they confer exceptional durability. Interestingly, the resistance of Lr34 is associated with the expression of leaf tip necrosis (LTN) and Sr2 with pseudo-black chaff (PBC). Genome-wide association mapping using CIMMYT’s stem rust resistance screening nursery (SRRSN) wheat lines was done to identify genotyping-bysequencing (GBS) markers linked to LTN and PBC. Phenotyping for these traits was done in Ithaca, New York (fall 2011); Njoro, Kenya (main and off-seasons, 2012), and Wellington, India (winter, 2013). Using the mixed linear model (MLM), 18 GBS markers were significantly associated with LTN. While some markers were linked to loci where the durable leaf rust resistance genes Lr34 (7DS), Lr46 (1BL), and Lr68 (7BL) were mapped, significant associations were also detected with other loci on 2BL, 5B, 3BS, 4BS, and 7BS. Twelve GBS markers linked to the Sr2 locus (3BS) and loci on 2DS, 4AL, and 7DS were significantly associated with PBC. This study provides insight into the complex genetic control of LTN and PBC. Further efforts to validate and study these loci might aid in determining the nature of their association with durable resistance.

Original languageEnglish (US)
JournalPlant Genome
Volume8
Issue number2
DOIs
StatePublished - Jan 1 2015
Externally publishedYes

Fingerprint

chaff
Triticum
chromosome mapping
necrosis
Necrosis
Genome
loci
wheat
genome
genotyping
leaves
Nurseries
Kenya
stem rust
Genes
leaf rust
India
Linear Models
durability
Triticum aestivum

ASJC Scopus subject areas

  • Genetics
  • Agronomy and Crop Science
  • Plant Science

Cite this

Genome-wide association mapping for leaf tip necrosis and pseudo-black chaff in relation to durable rust resistance in wheat. / Juliana, Philomin; Rutkoski, Jessica E.; Poland, Jesse A.; Singh, Ravi P.; Murugasamy, Sivasamy; Natesan, Senthil; Barbier, Hugues; Sorrells, Mark E.

In: Plant Genome, Vol. 8, No. 2, 01.01.2015.

Research output: Contribution to journalArticle

Juliana, Philomin ; Rutkoski, Jessica E. ; Poland, Jesse A. ; Singh, Ravi P. ; Murugasamy, Sivasamy ; Natesan, Senthil ; Barbier, Hugues ; Sorrells, Mark E. / Genome-wide association mapping for leaf tip necrosis and pseudo-black chaff in relation to durable rust resistance in wheat. In: Plant Genome. 2015 ; Vol. 8, No. 2.
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