Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying

Philip Heil, Wenhua Gu, Sangho Lim, Hyungsoo Choi, Kyekyoon Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Nanoscale structures of copper including nanowires, nanoparticles, and thin films were produced using flow-limited field-injection electrostatic spraying (FFESS) combined with chemical vapor deposition (CVD). The FFESS system allowed for efficient vaporization and delivery of the CVD precursor. The system also allowed for control of the type of structures based on deposition parameters. X-ray photoelectron spectroscopy (XPS) data confirmed that the samples were pure copper.

Original languageEnglish (US)
Title of host publication2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Pages484-485
Number of pages2
Volume1
DOIs
StatePublished - Dec 1 2006
Event2006 IEEE Nanotechnology Materials and Devices Conference, NMDC - Gyeongju, Korea, Republic of
Duration: Oct 22 2006Oct 25 2006

Other

Other2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
CountryKorea, Republic of
CityGyeongju
Period10/22/0610/25/06

Fingerprint

Spraying
Nanowires
Copper
Chemical vapor deposition
Electrostatics
Nanoparticles
Thin films
Vaporization
X ray photoelectron spectroscopy

Keywords

  • Copper nanoparticles
  • Copper nanowires
  • Copper thin film
  • FFESS
  • Nanoparticle synthesis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)

Cite this

Heil, P., Gu, W., Lim, S., Choi, H., & Kim, K. (2006). Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying. In 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC (Vol. 1, pp. 484-485). [4388828] https://doi.org/10.1109/NMDC.2006.4388828

Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying. / Heil, Philip; Gu, Wenhua; Lim, Sangho; Choi, Hyungsoo; Kim, Kyekyoon.

2006 IEEE Nanotechnology Materials and Devices Conference, NMDC. Vol. 1 2006. p. 484-485 4388828.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Heil, P, Gu, W, Lim, S, Choi, H & Kim, K 2006, Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying. in 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC. vol. 1, 4388828, pp. 484-485, 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC, Gyeongju, Korea, Republic of, 10/22/06. https://doi.org/10.1109/NMDC.2006.4388828
Heil P, Gu W, Lim S, Choi H, Kim K. Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying. In 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC. Vol. 1. 2006. p. 484-485. 4388828 https://doi.org/10.1109/NMDC.2006.4388828
Heil, Philip ; Gu, Wenhua ; Lim, Sangho ; Choi, Hyungsoo ; Kim, Kyekyoon. / Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying. 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC. Vol. 1 2006. pp. 484-485
@inproceedings{8e6d3ba9a41b4334ad013ecf1ea8233a,
title = "Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying",
abstract = "Nanoscale structures of copper including nanowires, nanoparticles, and thin films were produced using flow-limited field-injection electrostatic spraying (FFESS) combined with chemical vapor deposition (CVD). The FFESS system allowed for efficient vaporization and delivery of the CVD precursor. The system also allowed for control of the type of structures based on deposition parameters. X-ray photoelectron spectroscopy (XPS) data confirmed that the samples were pure copper.",
keywords = "Copper nanoparticles, Copper nanowires, Copper thin film, FFESS, Nanoparticle synthesis",
author = "Philip Heil and Wenhua Gu and Sangho Lim and Hyungsoo Choi and Kyekyoon Kim",
year = "2006",
month = "12",
day = "1",
doi = "10.1109/NMDC.2006.4388828",
language = "English (US)",
isbn = "1424405408",
volume = "1",
pages = "484--485",
booktitle = "2006 IEEE Nanotechnology Materials and Devices Conference, NMDC",

}

TY - GEN

T1 - Generation and characterization of copper nanowires, nanoparticles, and thin films by flow-limited field-injection electrostatic spraying

AU - Heil, Philip

AU - Gu, Wenhua

AU - Lim, Sangho

AU - Choi, Hyungsoo

AU - Kim, Kyekyoon

PY - 2006/12/1

Y1 - 2006/12/1

N2 - Nanoscale structures of copper including nanowires, nanoparticles, and thin films were produced using flow-limited field-injection electrostatic spraying (FFESS) combined with chemical vapor deposition (CVD). The FFESS system allowed for efficient vaporization and delivery of the CVD precursor. The system also allowed for control of the type of structures based on deposition parameters. X-ray photoelectron spectroscopy (XPS) data confirmed that the samples were pure copper.

AB - Nanoscale structures of copper including nanowires, nanoparticles, and thin films were produced using flow-limited field-injection electrostatic spraying (FFESS) combined with chemical vapor deposition (CVD). The FFESS system allowed for efficient vaporization and delivery of the CVD precursor. The system also allowed for control of the type of structures based on deposition parameters. X-ray photoelectron spectroscopy (XPS) data confirmed that the samples were pure copper.

KW - Copper nanoparticles

KW - Copper nanowires

KW - Copper thin film

KW - FFESS

KW - Nanoparticle synthesis

UR - http://www.scopus.com/inward/record.url?scp=50249131316&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=50249131316&partnerID=8YFLogxK

U2 - 10.1109/NMDC.2006.4388828

DO - 10.1109/NMDC.2006.4388828

M3 - Conference contribution

SN - 1424405408

SN - 9781424405404

VL - 1

SP - 484

EP - 485

BT - 2006 IEEE Nanotechnology Materials and Devices Conference, NMDC

ER -