@article{9348759d142c4289a7cf59c5b5a09169,
title = "GaN remote epitaxy on a pristine graphene buffer layer via controlled graphitization of SiC",
abstract = "Freestanding semiconductor membranes hold significant potential for heterogeneous integration technology and flexible electronics. Remote epitaxy, which leverages electrostatic interactions between epilayers and substrates through two-dimensional (2D) materials such as graphene, offers a promising solution for fabricating freestanding single-crystal membranes. Although the thinness, uniformity, and cleanness of 2D materials need to be meticulously controlled to enable the remote epitaxy of high-quality thin films, attaining such ideal growth templates has been challenging thus far. In this study, we demonstrate a controlled graphitization method to form a pristine graphene buffer layer (GBL) directly on SiC substrates and utilize this GBL template for GaN remote epitaxy. The quasi-two-dimensional GBL layer obtained by the method is completely free of damage or contamination, facilitating strong epitaxial interaction between the GaN epilayer and the SiC substrate. Furthermore, we reveal that a two-step growth of GaN on this GBL template enables the formation of single-crystal GaN epilayers and their exfoliation. Thus, this study represents an important step toward developing high-quality, freestanding semiconductor membranes.",
author = "Seokje Lee and Jekyung Kim and Park, {Bo In} and Kim, {Han Ik} and Changhyun Lim and Eunsu Lee and Yang, {Jeong Yong} and Joonghoon Choi and Hong, {Young Joon} and Chang, {Celesta S.} and Kum, {Hyun S.} and Jeehwan Kim and Kyusang Lee and Hyunseok Kim and Yi, {Gyu Chul}",
note = "We acknowledge the financial support provided by the National Research Foundation of Korea (NRF) (Award No. NRF-2021R1A5A1032996), the U.S. Air Force Office of Scientific Research (AFOSR) Young Investigator Program (YIP) (Award No. FA9550-23-1-0159), AFOSR (Award No. FA9550-22-1-0024), the National Science Foundation (NSF) (Award No. ECCS-2328839), and the Defense Advanced Research Projects Agency (DARPA) Young Faculty Award (Award No. D19AP00037-07). This work was also supported by the Technology Innovation Program Development Program (No. RS-2024-00417435, Development of 6-in. nitride-based RGB Epi-wafer growth technology with surface defect density below 1ea/cm) funded by the Ministry of Trade, Industry & Energy (MOTIE, Korea), and by the Korea Evaluation Institute of Industrial Technology (KEIT) grant funded by MOTIE (No. RS-2023-00225827, Development of implementation technology for core devices based on Si-GaN hybrid semiconductor). This work was also supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (Nos. RS-2024-00445081 and RS-2024-00451173). Additionally, we appreciate the valuable support from the Brain Korea 21-Plus Program, the Institute of Applied Physics (IAP), and the Research Institute of Advanced Materials (RIAM) at Seoul National University. We acknowledge the financial support provided by the National Research Foundation of Korea (NRF) (Award No. NRF-2021R1A5A1032996), the U.S. Air Force Office of Scientific Research (AFOSR) Young Investigator Program (YIP) (Award No. FA9550-23-1-0159), AFOSR (Award No. FA9550-22-1-0024), the National Science Foundation (NSF) (Award No. ECCS-2328839), and the Defense Advanced Research Projects Agency (DARPA) Young Faculty Award (Award No. D19AP00037-07). This work was also supported by the Technology Innovation Program Development Program (No. RS-2024-00417435, Development of 6-in. nitride-based RGB Epi-wafer growth technology with surface defect density below 1ea/cm2) funded by the Ministry of Trade, Industry & Energy (MOTIE, Korea), and by the Korea Evaluation Institute of Industrial Technology (KEIT) grant funded by MOTIE (No. RS-2023-00225827, Development of implementation technology for core devices based on Si-GaN hybrid semiconductor). This work was also supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (Nos. RS-2024-00445081 and RS-2024-00451173). Additionally, we appreciate the valuable support from the Brain Korea 21-Plus Program, the Institute of Applied Physics (IAP), and the Research Institute of Advanced Materials (RIAM) at Seoul National University.",
year = "2024",
month = dec,
day = "16",
doi = "10.1063/5.0235653",
language = "English (US)",
volume = "125",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "25",
}