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GaN epitaxial lateral overgrowth and optical characterization
X. Li
, S. G. Bishop, J. J. Coleman
Electrical and Computer Engineering
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Keyphrases
Optical Characterization
100%
Epitaxial Lateral Overgrowth
100%
Optical Properties
33%
Metal-organic Chemical Vapor Deposition (MOCVD)
33%
Spatially Resolved
33%
Cathodoluminescence Spectroscopy
33%
Atmospheric Pressure
33%
Line Scan
33%
Imaging Scan
33%
Yellow Emission
33%
Optical Quality
33%
Triangular Cross-section
33%
GaN Material
33%
Narrow Stripe
33%
Free Exciton
33%
Engineering
Cross Section
100%
Atmospheric Pressure
100%
Metal Organic Chemical Vapor Deposition
100%
Optical Quality
100%
Grown Material
100%
Material Science
Optical Property
100%
Metal-Organic Chemical Vapor Deposition
100%
Cathodoluminescence Spectroscopy
100%