Full-component modeling and simulation of charged device model ESD

Kuo Hsuan Meng, Vrashank Shukla, Elyse Rosenbaum

Research output: Contribution to journalArticlepeer-review


This paper presents a methodology to construct an equivalent circuit model of a packaged integrated circuit mounted on a field-induced charged device model electrostatic discharge tester. Circuit simulation is used to obtain the full-component current and voltage distributions. This paper focuses on predicting overvoltage stress at power domain crossing circuits.

Original languageEnglish (US)
Article number7308012
Pages (from-to)1105-1113
Number of pages9
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue number7
StatePublished - Jul 2016


  • Charged device model (CDM)
  • Circuit simulation
  • Cross-domain stress
  • Emulates electrostatic discharges (ESD)
  • Modeling

ASJC Scopus subject areas

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering


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