From scanning electron nanodiffraction to 4D-STEM: How and why coherence matters

Jian Min Zuo, Renliang Yuan, Haw Wen Hsiao

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S1431927620016517
State	Accepted/In press - 2020

ASJC Scopus subject areas

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title = "From scanning electron nanodiffraction to 4D-STEM: How and why coherence matters",

author = "Zuo, {Jian Min} and Renliang Yuan and Hsiao, {Haw Wen}",

year = "2020",

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language = "English (US)",

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AU - Zuo, Jian Min

AU - Yuan, Renliang

AU - Hsiao, Haw Wen

PY - 2020

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SN - 1431-9276

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JF - Microscopy and Microanalysis

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