From pulsed laser vibrometer to optical doppler velocimeter: Laser metrology using photo-EMF sensors

Chen Chia Wang, Sudhir Trivedi, Feng Jin, Gregory S Elliott, Stephen Tse, Ponciano Rodriguez, Serguei Stepanov, James F. Meyers, Joseph Lee

Research output: Contribution to conferencePaperpeer-review

Abstract

Recent progresses in using photo-electromotive-force (photo-EMF) sensors for a variety of laser metrological applications are discussed. We'll present an overview on the device physics for photo-EMF sensors and discuss recent experimental results on several fronts, including highly sensitive pulsed laser vibrometers for surface vibration monitoring and laser ultrasonic diagnostics, interferometer-less coherent optical distance range finder with sub-laser wavelength precision, as well as laser Doppler velocimetry studies on hard surfaces.

Original languageEnglish (US)
Pages5320-5325
Number of pages6
StatePublished - 2004
Event42nd AIAA Aerospace Sciences Meeting and Exhibit - Reno, NV, United States
Duration: Jan 5 2004Jan 8 2004

Conference

Conference42nd AIAA Aerospace Sciences Meeting and Exhibit
Country/TerritoryUnited States
CityReno, NV
Period1/5/041/8/04

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint

Dive into the research topics of 'From pulsed laser vibrometer to optical doppler velocimeter: Laser metrology using photo-EMF sensors'. Together they form a unique fingerprint.

Cite this