TY - GEN
T1 - From finance to flip flops
T2 - 8th International Symposium on Quality Electronic Design, ISQED 2007
AU - Singhee, Amith
AU - Rutenbar, Rob A.
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2007
Y1 - 2007
N2 - Problems in computational finance share many of the characteristics that challenge us in statistical circuit analysis: high dimensionality, profound nonlinearity, stringent accuracy requirements, and expensive sample simulation. We offer a detailed experimental study of how one celebrated technique from this domain - Quasi-Monte Carlo (QMC) analysis - can be used for fast statistical circuit analysis. In contrast with traditional pseudo-random Monte Carlo sampling, QMC substitutes a (shorter) sequence of deterministically chosen sample points. Across a set of digital and analog circuits, in 90nm and 45nm technologies, varying in size from 30 to 400 devices, we obtain speedups in parametric yield estimation from 2X to 50X.
AB - Problems in computational finance share many of the characteristics that challenge us in statistical circuit analysis: high dimensionality, profound nonlinearity, stringent accuracy requirements, and expensive sample simulation. We offer a detailed experimental study of how one celebrated technique from this domain - Quasi-Monte Carlo (QMC) analysis - can be used for fast statistical circuit analysis. In contrast with traditional pseudo-random Monte Carlo sampling, QMC substitutes a (shorter) sequence of deterministically chosen sample points. Across a set of digital and analog circuits, in 90nm and 45nm technologies, varying in size from 30 to 400 devices, we obtain speedups in parametric yield estimation from 2X to 50X.
UR - http://www.scopus.com/inward/record.url?scp=34548124914&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34548124914&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2007.79
DO - 10.1109/ISQED.2007.79
M3 - Conference contribution
AN - SCOPUS:34548124914
SN - 0769527957
SN - 9780769527956
T3 - Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
SP - 685
EP - 692
BT - Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
Y2 - 26 March 2007 through 28 March 2007
ER -