Fresnel particle tracing in three dimensions using diffraction phase microscopy

Keyphrases

• Diffraction Phase Microscopy 100%
• Particle Tracing 100%
• Fresnel 100%
• High Sensitivity 50%
• Nanometer Resolution 50%
• Acquisition Rate 50%
• Quantitative Phase Imaging 50%
• Wavefront 50%
• Small Particles 50%
• Transverse Distribution 50%
• Recording Time 50%
• Micrometer-sized Particles 50%
• Jittering 50%
• Fresnel Approximation 50%
• Imaging Capability 50%
• Brownian Particle 50%

Engineering

• Nanometre 100%
• Experimental Technique 100%
• Brownian Particle 100%
• Sized Particle 100%