TY - GEN
T1 - Fourth workshop on dependable and secure nanocomputing
AU - Arlat, Jean
AU - Constantinescu, Cristian
AU - Iyer, Ravishankar K.
AU - Karlsson, Johan
AU - Nicoläidis, Michael
PY - 2010
Y1 - 2010
N2 - Nanocomputing technologies hold the promise for higher performance, lower power consumption as well as increased functionality. However, the dependability of these unprecedentedly small scale devices remains uncertain. The main sources of concern are: • Nanometer devices are expected to be highly sensitive to process variations. The guard-bands used today for avoiding the impact of such variations will not represent a feasible solution in the future. Thus, timing errors may occur more frequently. • New failure modes, specific to new materials, are expected to raise serious challenges to the design and test engineers. • Environment induced errors, like single event upsets (SED), are likely to occur more frequently than in the case of conventional semiconductor devices. • New hardware redundancy techniques are needed to enable development of energy efficient systems. • The increased complexity of the systems based on nanotechnology will require improved computer aided design (CAD) tools, as well as better validation techniques. • Security of nanocomputing systems may be threatened by malicious attacks targeting new vulnerable areas in the hardware.
AB - Nanocomputing technologies hold the promise for higher performance, lower power consumption as well as increased functionality. However, the dependability of these unprecedentedly small scale devices remains uncertain. The main sources of concern are: • Nanometer devices are expected to be highly sensitive to process variations. The guard-bands used today for avoiding the impact of such variations will not represent a feasible solution in the future. Thus, timing errors may occur more frequently. • New failure modes, specific to new materials, are expected to raise serious challenges to the design and test engineers. • Environment induced errors, like single event upsets (SED), are likely to occur more frequently than in the case of conventional semiconductor devices. • New hardware redundancy techniques are needed to enable development of energy efficient systems. • The increased complexity of the systems based on nanotechnology will require improved computer aided design (CAD) tools, as well as better validation techniques. • Security of nanocomputing systems may be threatened by malicious attacks targeting new vulnerable areas in the hardware.
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U2 - 10.1109/DSN.2010.5544423
DO - 10.1109/DSN.2010.5544423
M3 - Conference contribution
AN - SCOPUS:77956579341
SN - 9781424475018
T3 - Proceedings of the International Conference on Dependable Systems and Networks
SP - 619
EP - 620
BT - Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010
T2 - 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010
Y2 - 28 June 2010 through 1 July 2010
ER -