Form factor dispersion at la M5,4 edges and average density of resonant atoms

S. Smadici, J. C.T. Lee, G. Logvenov, I. Bozovic, P. Abbamonte

Research output: Contribution to journalArticle

Abstract

Resonant soft x-ray scattering on complex oxide superlattices shows very large variations in the superlattice reflection position and intensity near La M5,4 edges. Resonant dispersion of the La x-ray form factor describes the observations well. We determine the average density of resonant La atoms and the thickness of superlattice layers.

Original languageEnglish (US)
Article number025303
JournalJournal of Physics Condensed Matter
Volume26
Issue number2
DOIs
StatePublished - Jan 15 2014

Keywords

  • form factor
  • resonant
  • superlattice
  • x-ray scattering

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Materials Science(all)

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