Form factor dispersion at la M5,4 edges and average density of resonant atoms

S. Smadici; J. C.T. Lee; G. Logvenov; I. Bozovic; P. Abbamonte

doi:10.1088/0953-8984/26/2/025303

Form factor dispersion at la M_5,4 edges and average density of resonant atoms

S. Smadici, J. C.T. Lee, G. Logvenov, I. Bozovic, P. Abbamonte

Research output: Contribution to journal › Article › peer-review

Abstract

Resonant soft x-ray scattering on complex oxide superlattices shows very large variations in the superlattice reflection position and intensity near La M_5,4 edges. Resonant dispersion of the La x-ray form factor describes the observations well. We determine the average density of resonant La atoms and the thickness of superlattice layers.

Original language	English (US)
Article number	025303
Journal	Journal of Physics Condensed Matter
Volume	26
Issue number	2
DOIs	https://doi.org/10.1088/0953-8984/26/2/025303
State	Published - Jan 15 2014

Keywords

form factor
resonant
superlattice
x-ray scattering

ASJC Scopus subject areas

Condensed Matter Physics
Materials Science(all)

Online availability

10.1088/0953-8984/26/2/025303

Library availability

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Cite this

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AU - Logvenov, G.

AU - Bozovic, I.

AU - Abbamonte, P.

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KW - form factor

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KW - superlattice

KW - x-ray scattering

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