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FOCUS: An Experimental Environment for Fault Sensitivity Analysis
Gwan S. Choi,
Ravishankar K Iyer
Electrical and Computer Engineering
National Center for Supercomputing Applications (NCSA)
Carl R. Woese Institute for Genomic Biology
Coordinated Science Lab
Information Trust Institute
Biomedical and Translational Sciences
Siebel School of Computing and Data Science
Center for Global Studies
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Keyphrases
Experimental Environment
100%
Fault Sensitivity Analysis
100%
Dynamic Behavior
33%
Simulation Environment
33%
Sensitivity Analysis
33%
Chip-level
33%
Early Design Phases
33%
Design Analysis
33%
Level Design
33%
Level-sensitivity
33%
Alternative Design
33%
Transient Fault
33%
Charging Level
33%
Impact Assessment
33%
Error Distribution
33%
Error Propagation
33%
Engine Controller
33%
Microprocessor Based
33%
Jet Engine
33%
Fault Propagation
33%
Functional Error
33%
Transient Impact
33%
Critical Fault
33%
Design Tactics
33%
Transient Charge
33%
Fault Propagation Path
33%
Through the Gate
33%
Engineering
Transients
100%
Dynamic Behavior
33%
Simulation Environment
33%
Design Analysis
33%
Propagation Path
33%
Propagation Model
33%
Design Stage
33%
Jet Engine
33%
Error Distribution
33%
Latch Pin
33%
Microprocessor
33%