First principles methods for defects: State-of-the-art and emerging approaches

Elif Ertekin, Hannes Raebiger

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish (US)
Title of host publicationCharacterisation and Control of Defects in Semiconductors
PublisherInstitution of Engineering and Technology
Number of pages55
ISBN (Electronic)9781785616556
StatePublished - Jan 1 2019

ASJC Scopus subject areas

  • General Engineering

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