First principles methods for defects: State-of-the-art and emerging approaches

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English (US)
Title of host publication	Characterisation and Control of Defects in Semiconductors
Publisher	Institution of Engineering and Technology
Pages	289-343
Number of pages	55
ISBN (Electronic)	9781785616556
State	Published - Jan 1 2019

ASJC Scopus subject areas

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title = "First principles methods for defects: State-of-the-art and emerging approaches",

author = "Elif Ertekin and Hannes Raebiger",

year = "2019",

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language = "English (US)",

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booktitle = "Characterisation and Control of Defects in Semiconductors",

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