TY - GEN
T1 - Finite difference schemes for transient simulation of transmission lines exhibiting uncertainties
AU - Chen, Xu
AU - Schutt-Ainé, José E.
AU - Cangellaris, Andreas C.
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/6/20
Y1 - 2016/6/20
N2 - Finite difference numerical schemes are shown to be effective at propogating the effects of uncertainties in time domain. Stochastic LIM is based on the Stochastic Galerkin Method applied to finite difference leapfrog-based Latency Insertion Method. In this paper, two techniques for simulating transmission lines exhibiting uncertainties are discussed. The geometric and material uncertainties in a transmission line is characterized by the probability distribution of its per-unit-length R, L, G, C parameters. Then, transient simulation of equivalent stochastic circuit is performed using Stochastic LIM and also deterministic LIM with Stochastic Collcation.
AB - Finite difference numerical schemes are shown to be effective at propogating the effects of uncertainties in time domain. Stochastic LIM is based on the Stochastic Galerkin Method applied to finite difference leapfrog-based Latency Insertion Method. In this paper, two techniques for simulating transmission lines exhibiting uncertainties are discussed. The geometric and material uncertainties in a transmission line is characterized by the probability distribution of its per-unit-length R, L, G, C parameters. Then, transient simulation of equivalent stochastic circuit is performed using Stochastic LIM and also deterministic LIM with Stochastic Collcation.
UR - http://www.scopus.com/inward/record.url?scp=84980334574&partnerID=8YFLogxK
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U2 - 10.1109/SaPIW.2016.7496311
DO - 10.1109/SaPIW.2016.7496311
M3 - Conference contribution
AN - SCOPUS:84980334574
T3 - 2016 IEEE 20th Workshop on Signal and Power Integrity, SPI 2016 - Proceedings
BT - 2016 IEEE 20th Workshop on Signal and Power Integrity, SPI 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 20th IEEE Workshop on Signal and Power Integrity, SPI 2016
Y2 - 8 May 2016 through 11 May 2016
ER -