Abstract
The signal degradation stemming from the conductor loss and the substrate dispersion of coplanar waveguides for the high-speed digital circuits is analyzed by a combination of the original and frequency-dependent versions of the FDTD method. The metallic strips with the finite thickness are described by the equivalent Z-parameters. The backed conductor, if any, is modelled by the surface impedance. The dispersive property of the GaAs substrate is formulated by using the Kronig-Kramers relationship. The simulation results demonstrate the signal degradation due to modal dispersion, conductor loss, substrate dispersion and leakage effects in a conductor backed CPW structure.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1835-1838 |
| Number of pages | 4 |
| Journal | IEEE MTT-S International Microwave Symposium Digest |
| Volume | 3 |
| State | Published - 1996 |
| Externally published | Yes |
| Event | Proceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3) - San Franscisco, CA, USA Duration: Jun 17 1996 → Jun 21 1996 |
ASJC Scopus subject areas
- Radiation
- Condensed Matter Physics
- Electrical and Electronic Engineering