FAULT LATENCY IN THE MEMORY - AN EXPERIMENTAL STUDY ON VAX 11/780.

Ram Chillarege, Ravishankar K. Iyer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Fault latency is the time between the physical occurrence of a fault and its corruption of data, causing an error. The measure of this time is difficult to obtain because the time of occurrence of a fault and the exact moment of generation of an error are not known. An experiment to accurately study the fault latency in the memory subsystem is described. The experiment uses real memory data from a VAX 11/780 running UNIX. Fault latency distributions are generated for s-a-0 and s-a-1 permanent fault models. Results show that the mean fault latency of a s-a-0 fault is nearly 5 times that of the s-a-1 fault. Large variations in fault latency are found for different regions in memory. An analysis-of-variance model, to quantify the relative influence of various workload measures on the evaluated latency, is also given.

Original languageEnglish (US)
Title of host publicationDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
PublisherIEEE
Pages258-263
Number of pages6
ISBN (Print)0818607033
StatePublished - Jan 1 1986

Publication series

NameDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)0731-3071

ASJC Scopus subject areas

  • Hardware and Architecture

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    Chillarege, R., & Iyer, R. K. (1986). FAULT LATENCY IN THE MEMORY - AN EXPERIMENTAL STUDY ON VAX 11/780. In Digest of Papers - FTCS (Fault-Tolerant Computing Symposium) (pp. 258-263). (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)). IEEE.