@inproceedings{7d97cb0c2fd14386b59d49a1fa589e27,
title = "Fault behavior dictionary for simulation of device-level transients",
abstract = "This paper presents a methodology for the simulation of massive number of device-level transient faults. Fault injection locations and the gates around those locations are extracted and evaluated with SPICE. The extracted sub-circuits are exercised exhaustively while fault-injections are performed. Faulty behavior at the outputs of each sub-circuit is recorded in a dictionary, along with the associated input vector, fault-injection time, and location. The recorded logical errors are injected concurrently at run-time on the target design. A concurrent transient simulator is developed to allow simultaneous evaluation of a massive number of fault-injections, in a single simulation pass. The methodology is illustrated by a case study of MC68000 microprocessor.",
author = "Choi, {Gwan S.} and Iyer, {Ravishankar K} and Saab, {Daniel G.}",
year = "1993",
language = "English (US)",
isbn = "0818644923",
series = "Proc 1993 IEEE ACM Int Conf Comput Aided Des",
publisher = "Publ by IEEE",
pages = "6--9",
editor = "Anon",
booktitle = "Proc 1993 IEEE ACM Int Conf Comput Aided Des",
note = "Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design ; Conference date: 07-11-1993 Through 11-11-1993",
}