Fast scanning of X-Ray optics: An optimal control approach

Sheikh T. Mashrafi, Curt Preissner, Srinivasa M. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper shows the making of an X-Ray microscope that reflects the requirements of the APS upgrade. The identification of the diagonal and the off-diagonal stages of the PI XYZ stages are detailed. The controller for diagonal XX-stage shows good tracking performance. The hysteresis and resolution experiments are not shown here. The parametric model fitting, controller design, and controller implementation for the remaining SISO diagonal stages and MIMO stage will be carried on in the usual manner and presented in subsequent articles.

Original languageEnglish (US)
Title of host publicationProceedings - ASPE 2016 Annual Meeting
PublisherAmerican Society for Precision Engineering, ASPE
Pages97-102
Number of pages6
ISBN (Electronic)9781887706728
StatePublished - Jan 1 2016
Event31st Annual Meeting of the American Society for Precision Engineering, ASPE 2016 - Portland, United States
Duration: Oct 23 2016Oct 28 2016

Publication series

NameProceedings - ASPE 2016 Annual Meeting

Other

Other31st Annual Meeting of the American Society for Precision Engineering, ASPE 2016
CountryUnited States
CityPortland
Period10/23/1610/28/16

    Fingerprint

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Mechanical Engineering

Cite this

Mashrafi, S. T., Preissner, C., & Salapaka, S. M. (2016). Fast scanning of X-Ray optics: An optimal control approach. In Proceedings - ASPE 2016 Annual Meeting (pp. 97-102). (Proceedings - ASPE 2016 Annual Meeting). American Society for Precision Engineering, ASPE.