Fast quantum interferometry at the nanometer and attosecond scales with energy-entangled photons

Colin P. Lualdi, Spencer J. Johnson, Michael Vayninger, Kristina A. Meier, Swetapadma Sahoo, Simeon I. Bogdanov, Paul G. Kwiat

Research output: Contribution to journalArticlepeer-review

Abstract

In classical optical interferometry, loss and background complicate achieving fast nanometer-resolution measurements with illumination at low light levels. Conversely, quantum two-photon interference is unaffected by loss and background, but nanometer-scale resolution is physically difficult to realize. As a solution, we enhance two-photon interference with highly nondegenerate energy entanglement featuring photon frequencies separated by 177 THz. We observe measurement resolution at the nanometer (attosecond) scale with only O(104) photon pairs, despite the presence of background and loss. Our nondestructive thickness measurement of a metallic thin film agrees with atomic force microscopy, which often achieves better resolution via destructive means. With contactless, nondestructive measurements in seconds or faster, our instrument enables metrological studies in optically challenging contexts where background, loss, or photosensitivity are factors.

Original languageEnglish (US)
Article numbereadw4938
JournalScience Advances
Volume11
Issue number21
DOIs
StatePublished - May 23 2025

ASJC Scopus subject areas

  • General

Fingerprint

Dive into the research topics of 'Fast quantum interferometry at the nanometer and attosecond scales with energy-entangled photons'. Together they form a unique fingerprint.

Cite this