Fast interval-valued statistical interconnect modeling and reduction

James D. Ma, Rob A. Rutenbar

Research output: Contribution to conferencePaper

Abstract

Correlated interval representations of range uncertainty offer an attractive solution for approximating computations on statistical quantities. The key idea is to use finite intervals to approximate the essential mass of a pdf as it moves through numerical operators; the resulting compact interval-valued solution can be easily interpreted as a statistical distribution and efficiently sampled. This paper describes improved interval-valued algorithms for AWE/PRIMA model order reduction for tree-structured interconnect with correlated RLC parameter variations. By moving to a faster interval-valued linear solver based on path-tracing ideas, and making more optimal tradeoffs between interval- and scalar-valued computations, we can extract delay statistics roughly 10X faster than a classical Monte Carlo simulation loop, with accuracy to within 5%.

Original languageEnglish (US)
Pages159-166
Number of pages8
DOIs
StatePublished - 2005
Event2005 International Symposium on Physical Design, ISPD'05 - San Francisco, CA, United States
Duration: Apr 3 2005Apr 6 2005

Other

Other2005 International Symposium on Physical Design, ISPD'05
CountryUnited States
CitySan Francisco, CA
Period4/3/054/6/05

Keywords

  • Affine Arithmetic
  • Interval-Valued Statistical Interconnect Analysis
  • Manufacturing Variation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Ma, J. D., & Rutenbar, R. A. (2005). Fast interval-valued statistical interconnect modeling and reduction. 159-166. Paper presented at 2005 International Symposium on Physical Design, ISPD'05, San Francisco, CA, United States. https://doi.org/10.1145/1055137.1055170