Fast Frequency Sweep Analysis of Passive Miniature RF Circuits Based on Analytic Extension of Eigenvalues

Hongliang Li, Jian Ming Jin, Douglas R. Jachowski, Robert B. Hammond

Research output: Contribution to journalArticlepeer-review

Abstract

A fast frequency sweep approach based on analytic extension of eigenvalues (AEE) is presented and investigated for an efficient analysis of miniature passive RF circuits. In this approach, an eigenvalue decomposition is performed to the Z-parameters of the circuit components at one or a few frequencies, and analytic extension is applied to obtain the eigenvalues at all other frequencies within the band of interest. For electrically small circuit components, the frequency-independent characteristic inductances and capacitances, as well as the frequency-dependent resistances, are extracted from the eigenvalues at the sampling frequencies. The extracted characteristic parameters are then used to approximate the Z- and Y-parameters and predict the responses of the circuit over the entire frequency band. The accuracy of this approach is evaluated by comparing it with the results from a full-wave analysis. It is found that the proposed AEE is very accurate with a relative error of less than 1% for miniature RF circuits whose electrical sizes are smaller than one tenth of the wavelength and is more general and powerful than the one based on lumped equivalent circuits.

Original languageEnglish (US)
Article number9241852
Pages (from-to)4-14
Number of pages11
JournalIEEE Transactions on Microwave Theory and Techniques
Volume69
Issue number1
DOIs
StatePublished - Jan 2021

Keywords

  • Eigenmode analysis
  • RF circuit modeling
  • fast frequency sweep
  • quasi-static analysis

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Fast Frequency Sweep Analysis of Passive Miniature RF Circuits Based on Analytic Extension of Eigenvalues'. Together they form a unique fingerprint.

Cite this