Fast Eye Diagram Simulation based on Latency Insertion Method

Yi Zhou, Bobi Shi, Yixuan Zhao, Jose E. Schutt-Aine

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Eye diagrams are used to assess the quality of high-speed channels. They are thus very important for signal integrity analysis. The voltage-in-current latency insertion method (VinC LIM) is a fast transient circuit simulation algorithm with superior stability properties. In this paper, VinC LIM is proven to be reliable for fast transient simulation of eye diagrams. The results and speed are compared with the transient simulation and channel simulation of commercial platforms.

Original languageEnglish (US)
Title of host publication2022 IEEE Electrical Design of Advanced Packaging and Systems, EDAPS 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665491945
DOIs
StatePublished - 2022
Event2022 IEEE Electrical Design of Advanced Packaging and Systems, EDAPS 2022 - Urbana, United States
Duration: Dec 12 2022Dec 14 2022

Publication series

NameIEEE Electrical Design of Advanced Packaging and Systems Symposium
Volume2022-December
ISSN (Print)2151-1225
ISSN (Electronic)2151-1233

Conference

Conference2022 IEEE Electrical Design of Advanced Packaging and Systems, EDAPS 2022
Country/TerritoryUnited States
CityUrbana
Period12/12/2212/14/22

Keywords

  • circuit simulation
  • eye diagram
  • high-speed link
  • latency insertion method
  • signal integrity

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Automotive Engineering
  • General Computer Science

Fingerprint

Dive into the research topics of 'Fast Eye Diagram Simulation based on Latency Insertion Method'. Together they form a unique fingerprint.

Cite this