Fast Diagnosis of Multiple Open-Circuit Faults in a T-type Inverter Based on Voltages across Half-Bridge Switches

Borong Wang, Philip T. Krein, Hao Ma, Zhihong Bai, Zhan Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a fast multiple semiconductor open-circuit fault diagnosis method for a T-type three-level inverter. In this method, appropriate Boolean operations are selected to represent the relationship between voltages across the upper half-bridge switches and switching signals. Based on this, the current path in the circuit can be tracked under normal and abnormal conditions. Logical relationships are linked to corresponding switch states, so this method is applicable even under multiple open circuit faults. Diagnosis results can be obtained rapidly, with simple hardware. Misdiagnosis caused by delays in power devices and sampling circuits can be avoided if switching signal dead time is longer than the total delay. This diagnostic scheme is immune to load disturbances and dead times. Experimental results obtained under various conditions demonstrate the applicability and performance of the approach.

Original languageEnglish (US)
Title of host publicationProceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538660539
DOIs
StatePublished - Dec 26 2018
Event2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018 - Shenzhen, China
Duration: Nov 4 2018Nov 7 2018

Publication series

NameProceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018

Other

Other2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018
CountryChina
CityShenzhen
Period11/4/1811/7/18

Keywords

  • Boolean operation
  • T-type inverter
  • fault diagnosis
  • multi-switch faults
  • open-circuit faults
  • signal delay

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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  • Cite this

    Wang, B., Krein, P. T., Ma, H., Bai, Z., & Li, Z. (2018). Fast Diagnosis of Multiple Open-Circuit Faults in a T-type Inverter Based on Voltages across Half-Bridge Switches. In Proceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018 [8590349] (Proceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PEAC.2018.8590349