@inproceedings{3c61ff1d24f24588b8899f916ae6f7bb,
title = "Fast Diagnosis of Multiple Open-Circuit Faults in a T-type Inverter Based on Voltages across Half-Bridge Switches",
abstract = "This paper proposes a fast multiple semiconductor open-circuit fault diagnosis method for a T-type three-level inverter. In this method, appropriate Boolean operations are selected to represent the relationship between voltages across the upper half-bridge switches and switching signals. Based on this, the current path in the circuit can be tracked under normal and abnormal conditions. Logical relationships are linked to corresponding switch states, so this method is applicable even under multiple open circuit faults. Diagnosis results can be obtained rapidly, with simple hardware. Misdiagnosis caused by delays in power devices and sampling circuits can be avoided if switching signal dead time is longer than the total delay. This diagnostic scheme is immune to load disturbances and dead times. Experimental results obtained under various conditions demonstrate the applicability and performance of the approach.",
keywords = "Boolean operation, T-type inverter, fault diagnosis, multi-switch faults, open-circuit faults, signal delay",
author = "Borong Wang and Krein, {Philip T.} and Hao Ma and Zhihong Bai and Zhan Li",
year = "2018",
month = dec,
day = "26",
doi = "10.1109/PEAC.2018.8590349",
language = "English (US)",
series = "Proceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018",
address = "United States",
note = "2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018 ; Conference date: 04-11-2018 Through 07-11-2018",
}