@inproceedings{c0d836d244664154a11baeb5e8ef0972,
title = "Fast circuit simulator for transient analysis of CDM ESD",
abstract = "The run-time for circuit-level CDM ESD simulation can be prohibitively long. By leveraging the specific properties of the problem formulation, run-time can be reduced without compromising accuracy. A reduced run-time is obtained by using cluster computing, and additional speed-up is achieved using specialized device models and a customized simulation engine.",
author = "Meng, {Kuo Hsuan} and Elyse Rosenbaum",
year = "2015",
month = oct,
day = "30",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015",
note = "37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015 ; Conference date: 27-09-2015 Through 02-10-2015",
}