Fast and accurate finite element analysis of large-scale three-dimensional photonic devices with a robust domain decomposition method

Ming Feng Xue, Young Mo Kang, Amir Arbabi, Steven J. McKeown, Lynford L. Goddard, Jian Ming Jin

Research output: Contribution to journalArticle

Abstract

A fast and accurate full-wave technique based on the dual-primal finite element tearing and interconnecting method and the second-order transmission condition is presented for large-scale three-dimensional photonic device simulations. The technique decomposes a general threedimensional electromagnetic problem into smaller subdomain problems so that parallel computing can be performed on distributed-memory computer clusters to reduce the simulation time significantly. With the electric fields computed everywhere, photonic device parameters such as transmission and reflection coefficients are extracted. Several photonic devices, with simulation volumes up to 1.9×104 (Λ/navg)3 and modeled with over one hundred million unknowns, are simulated to demonstrate the application, efficiency, and capability of this technique. The simulations show good agreement with experimental results and in a special case with a simplified two-dimensional simulation.

Original languageEnglish (US)
Pages (from-to)4437-4452
Number of pages16
JournalOptics Express
Volume22
Issue number4
DOIs
StatePublished - Feb 24 2014

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photonics
decomposition
simulation
distributed memory
memory (computers)
tearing
electromagnetism
reflectance
electric fields
coefficients

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Fast and accurate finite element analysis of large-scale three-dimensional photonic devices with a robust domain decomposition method. / Xue, Ming Feng; Kang, Young Mo; Arbabi, Amir; McKeown, Steven J.; Goddard, Lynford L.; Jin, Jian Ming.

In: Optics Express, Vol. 22, No. 4, 24.02.2014, p. 4437-4452.

Research output: Contribution to journalArticle

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