Fast analysis of the impact of interconnect routing variability on signal degradation

Juan S. Ochoa; Andreas C. Cangellaris

doi:10.1109/EPEPS.2012.6457905

Fast analysis of the impact of interconnect routing variability on signal degradation

Juan S. Ochoa
, Andreas C. Cangellaris

Coordinated Science Lab

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A computer model is proposed for the fast predictive analysis of the impact of interconnect routing variability on their broadband signal transmission properties. Through the use of a multi-conductor transmission line model of the interconnect structure and rational function interpolation in the frequency domain, the proposed model propagates routing variability described in terms of a set of properly defined random variables to broadband, stochastic scattering parameters for the transmission channel. In this manner, an efficient Monte Carlo analysis can be performed for the prediction of the statistics of the transient response of the channel due to routing uncertainty.

Original language	English (US)
Title of host publication	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012
Pages	315-318
Number of pages	4
DOIs	https://doi.org/10.1109/EPEPS.2012.6457905
State	Published - 2012
Event	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 - Tempe, AZ, United States Duration: Oct 21 2012 → Oct 24 2012

Publication series

Name	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012

Other

Other	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012
Country/Territory	United States
City	Tempe, AZ
Period	10/21/12 → 10/24/12

ASJC Scopus subject areas

Electrical and Electronic Engineering

Online availability

10.1109/EPEPS.2012.6457905

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Ochoa, J. S., & Cangellaris, A. C. (2012). Fast analysis of the impact of interconnect routing variability on signal degradation. In 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 (pp. 315-318). Article 6457905 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012). https://doi.org/10.1109/EPEPS.2012.6457905

Fast analysis of the impact of interconnect routing variability on signal degradation. / Ochoa, Juan S.; Cangellaris, Andreas C.
2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. p. 315-318 6457905 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ochoa, JS & Cangellaris, AC 2012, Fast analysis of the impact of interconnect routing variability on signal degradation. in 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012., 6457905, 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012, pp. 315-318, 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012, Tempe, AZ, United States, 10/21/12. https://doi.org/10.1109/EPEPS.2012.6457905

Ochoa JS, Cangellaris AC. Fast analysis of the impact of interconnect routing variability on signal degradation. In 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. p. 315-318. 6457905. (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012). doi: 10.1109/EPEPS.2012.6457905

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Fast analysis of the impact of interconnect routing variability on signal degradation

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