FAMAS: FAult Modeling via Adaptive Simulation

Keyphrases

• Fault Model 100%
• Adaptive Simulation 100%
• Error Probability 50%
• Model Building 25%
• Process Conditions 25%
• Semiconductor Devices 25%
• Electron-hole Pair 25%
• Messenger 25%
• Bias Voltage 25%
• Device Physics 25%
• Adaptive Approach 25%
• Transient Fault 25%
• Fault Injection 25%
• Spices 25%
• Through Fault 25%
• Electrical Conditions 25%
• Current Surge 25%

Engineering

• Fault Model 100%
• Simulators 50%
• Process Condition 50%
• Semiconductor Device 50%
• Hole Pair 50%
• SPICE 50%
• Bias Voltage 50%
• Transient Model 50%
• Level Physic 50%
• Electrical Condition 50%