@article{1ee2d6295b0c481a8a719c66d9e785cf,
title = "Extending 4D-STEM to Defect and Short-range Ordering Analysis: Principles, Methodology and Applications",
author = "Zuo, {Jian Min} and Hsiao, {Haw Wen} and Kaijun Yin and Ni, {Hsu Chih} and Haoyang Ni and Robert Busch and Renliang Yuan and Jiong Zhang",
year = "2023",
month = jul,
day = "22",
doi = "10.1093/micmic/ozad067.112",
language = "English (US)",
volume = "29",
pages = "249--250",
journal = "Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "1",
}