Exponential-edge transmission line pulsing for snap-back device characterization

Nicholas Thomson; Nathan Jack; Elyse Rosenbaum

doi:10.1109/IRPS.2012.6241820

Exponential-edge transmission line pulsing for snap-back device characterization

Nicholas Thomson, Nathan Jack, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.

Original language	English (US)
Title of host publication	2012 IEEE International Reliability Physics Symposium, IRPS 2012
DOIs	https://doi.org/10.1109/IRPS.2012.6241820
State	Published - 2012
Event	2012 IEEE International Reliability Physics Symposium, IRPS 2012 - Anaheim, CA, United States Duration: Apr 15 2012 → Apr 19 2012

Other

Other	2012 IEEE International Reliability Physics Symposium, IRPS 2012
Country	United States
City	Anaheim, CA
Period	4/15/12 → 4/19/12

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/IRPS.2012.6241820

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Cite this

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title = "Exponential-edge transmission line pulsing for snap-back device characterization",

abstract = "A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.",

author = "Nicholas Thomson and Nathan Jack and Elyse Rosenbaum",

year = "2012",

doi = "10.1109/IRPS.2012.6241820",

language = "English (US)",

isbn = "9781457716799",

booktitle = "2012 IEEE International Reliability Physics Symposium, IRPS 2012",

note = "2012 IEEE International Reliability Physics Symposium, IRPS 2012 ; Conference date: 15-04-2012 Through 19-04-2012",

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T1 - Exponential-edge transmission line pulsing for snap-back device characterization

AU - Thomson, Nicholas

AU - Jack, Nathan

AU - Rosenbaum, Elyse

PY - 2012

Y1 - 2012

N2 - A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.

AB - A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.

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U2 - 10.1109/IRPS.2012.6241820

DO - 10.1109/IRPS.2012.6241820

M3 - Conference contribution

AN - SCOPUS:84866595260

SN - 9781457716799

BT - 2012 IEEE International Reliability Physics Symposium, IRPS 2012

T2 - 2012 IEEE International Reliability Physics Symposium, IRPS 2012

Y2 - 15 April 2012 through 19 April 2012

ER -