Abstract
A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.
Original language | English (US) |
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Title of host publication | 2012 IEEE International Reliability Physics Symposium, IRPS 2012 |
DOIs | |
State | Published - 2012 |
Event | 2012 IEEE International Reliability Physics Symposium, IRPS 2012 - Anaheim, CA, United States Duration: Apr 15 2012 → Apr 19 2012 |
Other
Other | 2012 IEEE International Reliability Physics Symposium, IRPS 2012 |
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Country | United States |
City | Anaheim, CA |
Period | 4/15/12 → 4/19/12 |
ASJC Scopus subject areas
- Engineering(all)