TY - GEN
T1 - Exponential-edge transmission line pulsing for snap-back device characterization
AU - Thomson, Nicholas
AU - Jack, Nathan
AU - Rosenbaum, Elyse
PY - 2012
Y1 - 2012
N2 - A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.
AB - A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.
UR - http://www.scopus.com/inward/record.url?scp=84866595260&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84866595260&partnerID=8YFLogxK
U2 - 10.1109/IRPS.2012.6241820
DO - 10.1109/IRPS.2012.6241820
M3 - Conference contribution
AN - SCOPUS:84866595260
SN - 9781457716799
T3 - IEEE International Reliability Physics Symposium Proceedings
SP - 3E.2.1-3E.2.6
BT - 2012 IEEE International Reliability Physics Symposium, IRPS 2012
T2 - 2012 IEEE International Reliability Physics Symposium, IRPS 2012
Y2 - 15 April 2012 through 19 April 2012
ER -