Exponential-edge transmission line pulsing for snap-back device characterization

Nicholas Thomson, Nathan Jack, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.

Original languageEnglish (US)
Title of host publication2012 IEEE International Reliability Physics Symposium, IRPS 2012
DOIs
StatePublished - 2012
Event2012 IEEE International Reliability Physics Symposium, IRPS 2012 - Anaheim, CA, United States
Duration: Apr 15 2012Apr 19 2012

Other

Other2012 IEEE International Reliability Physics Symposium, IRPS 2012
CountryUnited States
CityAnaheim, CA
Period4/15/124/19/12

ASJC Scopus subject areas

  • Engineering(all)

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    Thomson, N., Jack, N., & Rosenbaum, E. (2012). Exponential-edge transmission line pulsing for snap-back device characterization. In 2012 IEEE International Reliability Physics Symposium, IRPS 2012 [6241820] https://doi.org/10.1109/IRPS.2012.6241820