Abstract
A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP.
| Original language | English (US) |
|---|---|
| Title of host publication | 2012 IEEE International Reliability Physics Symposium, IRPS 2012 |
| DOIs | |
| State | Published - 2012 |
| Event | 2012 IEEE International Reliability Physics Symposium, IRPS 2012 - Anaheim, CA, United States Duration: Apr 15 2012 → Apr 19 2012 |
Other
| Other | 2012 IEEE International Reliability Physics Symposium, IRPS 2012 |
|---|---|
| Country | United States |
| City | Anaheim, CA |
| Period | 4/15/12 → 4/19/12 |
ASJC Scopus subject areas
- Engineering(all)
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Cite this
Thomson, N., Jack, N., & Rosenbaum, E. (2012). Exponential-edge transmission line pulsing for snap-back device characterization. In 2012 IEEE International Reliability Physics Symposium, IRPS 2012 [6241820] https://doi.org/10.1109/IRPS.2012.6241820