Experimental methods and data analysis for fluctuation microscopy

P. M. Voyles, M. M.J. Treacy, J. M. Gibson, H. C. Jin, J. R. Abelson

Research output: Contribution to journalArticlepeer-review

Abstract

We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

Original languageEnglish (US)
Pages (from-to)155-160
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume589
StatePublished - Dec 1 2000

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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