Abstract
The evolution of thin-film morphologies during ion beam bombardment has been examined by a combination of experimental and molecular dynamics simulation methods. Surface roughness, stress and domain growth in amorphous and nanocrystalline films were investigated. The experiments provide support for the model of radiation-induced viscous flow. The coefficient of radiation-induced viscosity deduced from the experiments is insensitive to both the particular material and the irradiation particle. The computer simulations, using molecular dynamics, reveal that while flow may be caused by local melting of nanometer-sized regions along the track of the ion, in some cases the simple creation of point defects is sufficient to explain radiation-induced stress relaxation.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 246-252 |
| Number of pages | 7 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 212 |
| Issue number | 1-4 |
| DOIs | |
| State | Published - Dec 2003 |
| Event | Atomic Collisions in Solids - India, India Duration: Jan 19 2003 → Jan 24 2003 |
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation