Evolution of solder wettability with growth of interfacial compounds on tinned FeNi plating

Cai Chen, Lei Zhang, Qingquan Lai, Caifu Li, J. K. Shang

Research output: Contribution to journalArticlepeer-review

Abstract

Solder wettability of Sn/FeNi plated on copper coupon after various aging conditions was tested by the wetting balance method to investigate the influence of interfacial intermetallic compound (I-IMC) growth on the solderability of tinned FeNi plating. The wetting force was found to decrease slightly with the growth of a primary FeSn 2 layer at the Sn/FeNi interface. Subsequent growth of a CuNiSn compound layer over FeSn 2 improved wettability, resulting in an increase of the wetting force by 0.035 ± 0.005 N/m. The results indicated that the evolution of the solder wettability was related to different I-IMCs sequentially formed at the Sn/FeNi interface.

Original languageEnglish (US)
Pages (from-to)1234-1238
Number of pages5
JournalJournal of Materials Science: Materials in Electronics
Volume22
Issue number9
DOIs
StatePublished - Sep 2011
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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