Skip to main navigation Skip to search Skip to main content

Evidence from simulations for orientational medium range order in fluctuation-electron-microscopy observations of a-Si

  • S. V. Khare
  • , S. M. Nakhmanson
  • , P. M. Voyles
  • , P. Keblinski
  • , J. R. Abelson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)820-821
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - 2004

ASJC Scopus subject areas

  • Instrumentation

Cite this