Evidence from simulations for orientational medium range order in fluctuation-electron-microscopy observations of a-Si

S. V. Khare, S. M. Nakhmanson, P. M. Voyles, P. Keblinski, J. R. Abelson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)820-821
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2004

ASJC Scopus subject areas

  • Instrumentation

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