| Original language | English (US) |
|---|---|
| Pages (from-to) | 820-821 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 10 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - 2004 |
ASJC Scopus subject areas
- Instrumentation
Evidence from simulations for orientational medium range order in fluctuation-electron-microscopy observations of a-Si
S. V. Khare, S. M. Nakhmanson, P. M. Voyles, P. Keblinski, J. R. Abelson
Research output: Contribution to journal › Article › peer-review