TY - GEN
T1 - Every test makes a difference
T2 - 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016
AU - Ahmadyan, Seyed Nematollah
AU - Natarajan, Suriyaprakash
AU - Vasudevan, Shobha
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/3/7
Y1 - 2016/3/7
N2 - We introduce a methodology for automated test compression during electrical stress testing of analog and mixed signal circuits. This methodology optimally extracts only portions of a functional test that electrically stress the nets and devices of an analog circuit. We model test compression as a problem of optimizing functional of the transient response. We present a random tree based approach to find optimal solutions for these computationally hard integrals. We demonstrate with an op-amp, VCO and CMOS inverter that the method consistently reduces the length of each test by an average of 93%.
AB - We introduce a methodology for automated test compression during electrical stress testing of analog and mixed signal circuits. This methodology optimally extracts only portions of a functional test that electrically stress the nets and devices of an analog circuit. We model test compression as a problem of optimizing functional of the transient response. We present a random tree based approach to find optimal solutions for these computationally hard integrals. We demonstrate with an op-amp, VCO and CMOS inverter that the method consistently reduces the length of each test by an average of 93%.
UR - http://www.scopus.com/inward/record.url?scp=84996721545&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84996721545&partnerID=8YFLogxK
U2 - 10.1109/ASPDAC.2016.7428067
DO - 10.1109/ASPDAC.2016.7428067
M3 - Conference contribution
AN - SCOPUS:84996721545
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 539
EP - 544
BT - 2016 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 January 2016 through 28 January 2016
ER -