Every test makes a difference: Compressing analog tests to decrease production costs

Seyed Nematollah Ahmadyan, Suriyaprakash Natarajan, Shobha Vasudevan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We introduce a methodology for automated test compression during electrical stress testing of analog and mixed signal circuits. This methodology optimally extracts only portions of a functional test that electrically stress the nets and devices of an analog circuit. We model test compression as a problem of optimizing functional of the transient response. We present a random tree based approach to find optimal solutions for these computationally hard integrals. We demonstrate with an op-amp, VCO and CMOS inverter that the method consistently reduces the length of each test by an average of 93%.

Original languageEnglish (US)
Title of host publication2016 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages539-544
Number of pages6
ISBN (Electronic)9781467395694
DOIs
StatePublished - Mar 7 2016
Event21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016 - Macao, Macao
Duration: Jan 25 2016Jan 28 2016

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume25-28-January-2016

Other

Other21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016
CountryMacao
CityMacao
Period1/25/161/28/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Fingerprint Dive into the research topics of 'Every test makes a difference: Compressing analog tests to decrease production costs'. Together they form a unique fingerprint.

  • Cite this

    Ahmadyan, S. N., Natarajan, S., & Vasudevan, S. (2016). Every test makes a difference: Compressing analog tests to decrease production costs. In 2016 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016 (pp. 539-544). [7428067] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 25-28-January-2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASPDAC.2016.7428067