Etch depth dependence of differential quantum efficiency in single mode photonic crystal vertical cavity surface emitting lasers

Peun Tan Meng, Ansas Matthias Kasten, Dominic F. Siriani, Kent D. Choquette

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The etch depth dependence of differential quantum efficiency in single mode photonic crystal vertical cavity surface emitting lasers is investigated. Optical loss and thermal effects are shown to influence the etch depth dependence.

Original languageEnglish (US)
Title of host publication21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2008
Pages398-399
Number of pages2
DOIs
StatePublished - Dec 1 2008
Event21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2008 - Newport Beach, CA, United States
Duration: Nov 9 2008Nov 13 2008

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)1092-8081

Other

Other21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2008
Country/TerritoryUnited States
CityNewport Beach, CA
Period11/9/0811/13/08

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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