Keyphrases
Electrostatic Discharge
100%
High-speed Transceiver
100%
Self-protection
100%
Active Bias
100%
Input-output
37%
Signaling Pathway
12%
Transistor
12%
Induced Failures
12%
Gate Voltage
12%
Circuitry
12%
Complementary Metal Oxide Semiconductor
12%
I-V Curve
12%
Deleterious Effects
12%
Component Level
12%
Power Consumption
12%
Fast Transmission
12%
Signal Integrity
12%
Failure Analysis
12%
Area Overhead
12%
Protection Scheme
12%
Signal Power
12%
Transceiver
12%
Discharge Events
12%
Charged Device Model
12%
Transmission Line Pulsing
12%
Conditioning Regimen
12%
Discharge Polarity
12%
High Speed Signaling
12%
Physical Failure Analysis
12%
Semiconductor Test
12%
Engineering
Electrostatic Discharge
100%
Transceiver
100%
Self-Protection
100%
Failure Analysis
25%
Current-Voltage Characteristic
12%
Induced Failure
12%
Gate Voltage
12%
Complementary Metal-Oxide-Semiconductor
12%
Electric Lines
12%
Electric Power Utilization
12%
Area Overhead
12%
Protection Scheme
12%
Component Level
12%
Signal Path
12%
Speed Input
12%