@inproceedings{092497bd7748417b85d9eb92439aaa73,
title = "ESD-resilient active biasing scheme for high-speed SSTL I/Os",
abstract = "A bidirectional SSTL I/O which utilizes an active-biasing technique to achieve enhanced ESD resilience is presented. During an ESD event, each vulnerable transistor has an appropriate bias applied to minimize the peak voltage across gate oxide and drain-source regions. Active-bias control circuits can be substituted for secondary protection to improve circuit performance and ESD reliability.",
author = "Keel, {Min Sun} and Nathan Jack and Elyse Rosenbaum",
year = "2013",
month = oct,
day = "16",
language = "English (US)",
isbn = "9781585372324",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013",
note = "2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013 ; Conference date: 08-09-2013 Through 13-09-2013",
}