Error/failure analysis using event logs from fault tolerant systems

Inhwan Lee, Ravishankar K. Iyer, Dong Tang

Research output: Chapter in Book/Report/Conference proceedingConference contribution


A methodology for the analysis of automatically generated event logs from fault tolerant systems. The methodology is illustrated using event log data from three Tandem systems. Two are experimental systems, with nonstandard hardware and software components causing accelerated stresses and failures. Errors are identified on the basis of knowledge of the architectural and operational characteristics of the measured systems. The methodology takes a raw event log and reduces the data by event filtering and time-domain clustering. Probability distributions to characterize the error detection and recovery processes are obtained, and the corresponding hazards are calculated. Multivariate statistical techniques (factor analysis and cluster analysis) are used to investigate error and failure dependency among different system components. The dependency analysis is illustrated using processor halt data from one of the measured systems. It is found that the number of errors is small, even though the measurement period is relatively long. This reflects the high dependability of the measured systems.

Original languageEnglish (US)
Title of host publication91 Fault-Tolerant Comput. Symp.
PublisherPubl by IEEE
Number of pages8
ISBN (Print)0818621508
StatePublished - Jun 1 1991
Event21st International Symposium on Fault-Tolerant Computing - Montreal, Qui, Can
Duration: Jun 25 1991Jun 27 1991

Publication series

NameDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)0731-3071


Other21st International Symposium on Fault-Tolerant Computing
CityMontreal, Qui, Can

ASJC Scopus subject areas

  • Hardware and Architecture

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