Epitaxial SrRuO3/SrTiO3(100) analyzed using x-ray photoelectron spectroscopy

Barlaz D. Eitan; Haasch T. Richard; Seebauer G. Edmund

doi:10.1116/1.4999599

Epitaxial SrRuO₃/SrTiO₃(100) analyzed using x-ray photoelectron spectroscopy

Barlaz D. Eitan, Haasch T. Richard, Seebauer G. Edmund

Chemical and Biomolecular Engineering

Research output: Contribution to journal › Article

Abstract

X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO₃/SrTiO₃(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu_0.92O_3.41.

Original language	English (US)
Article number	024002
Journal	Surface Science Spectra
Volume	24
Issue number	2
DOIs	https://doi.org/10.1116/1.4999599
State	Published - Dec 1 2017

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ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

Cite this

Eitan, B. D., Richard, H. T., & Edmund, S. G. (2017). Epitaxial SrRuO₃/SrTiO₃(100) analyzed using x-ray photoelectron spectroscopy. Surface Science Spectra, 24(2), [024002]. https://doi.org/10.1116/1.4999599

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abstract = "X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.",

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AU - Eitan, Barlaz D.

AU - Richard, Haasch T.

AU - Edmund, Seebauer G.

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N2 - X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.

AB - X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.

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10.1116/1.4999599