Epitaxial SrRuO3/SrTiO3(100) analyzed using x-ray photoelectron spectroscopy

Barlaz D. Eitan; Haasch T. Richard; Seebauer G. Edmund

doi:10.1116/1.4999599

Epitaxial SrRuO₃/SrTiO₃(100) analyzed using x-ray photoelectron spectroscopy

Barlaz D. Eitan, Haasch T. Richard, Seebauer G. Edmund

Chemical and Biomolecular Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO₃/SrTiO₃(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu_0.92O_3.41.

Original language	English (US)
Article number	024002
Journal	Surface Science Spectra
Volume	24
Issue number	2
DOIs	https://doi.org/10.1116/1.4999599
State	Published - Dec 1 2017

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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@article{0d7c9c6675c4433b92bc680bb4318922,

title = "Epitaxial SrRuO3/SrTiO3(100) analyzed using x-ray photoelectron spectroscopy",

abstract = "X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.",

author = "Eitan, {Barlaz D.} and Richard, {Haasch T.} and Edmund, {Seebauer G.}",

note = "Funding Information: This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DESC0012704. This work was carried out in the Frederick Seitz Materials Research Laboratory Central Research Facilities, University of Illinois. D.E.B. acknowledges support from NSF (DMR 13-06822).",

year = "2017",

month = dec,

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doi = "10.1116/1.4999599",

language = "English (US)",

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journal = "Surface Science Spectra",

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AU - Eitan, Barlaz D.

AU - Richard, Haasch T.

AU - Edmund, Seebauer G.

N1 - Funding Information: This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DESC0012704. This work was carried out in the Frederick Seitz Materials Research Laboratory Central Research Facilities, University of Illinois. D.E.B. acknowledges support from NSF (DMR 13-06822).

PY - 2017/12/1

Y1 - 2017/12/1

N2 - X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.

AB - X-ray photoelectron spectroscopy (XPS) was used to analyze an epitaxially grown SrRuO3/SrTiO3(100) single crystal thin film. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ru 3p, C 1s, Ru 3d, Sr 3p, Sr 3d, Ru 4p, Sr 4s, O 2s, and Sr 4p core-level spectra and the valence band are presented. The spectra indicate the principle core-level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ru 3p, and Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of SrRu0.92O3.41.

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