Entangled-photon ellipsometry

Ayman F. Abouraddy, Kimani C. Toussaint, Alexander V. Sergienko, Bahaa E.A. Saleh, Malvin C. Teich

Research output: Contribution to journalArticlepeer-review


Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample, We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute, i.e., they require neither source nor detector calibration, nor do they require a reference.

Original languageEnglish (US)
Pages (from-to)656-662
Number of pages7
JournalJournal of the Optical Society of America B: Optical Physics
Issue number4
StatePublished - Apr 2002
Externally publishedYes

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Atomic and Molecular Physics, and Optics


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