Enhanced resolution in subsurface near-field optical microscopy

Roman Krutokhvostov, Alexander A. Govyadinov, Johannes M. Stiegler, Florian Huth, Andrey Chuvilin, P. Scott Carney, Rainer Hillenbrand

Research output: Contribution to journalArticlepeer-review


We report an experimental analysis of the capabilities of scattering-type scanning near-field optical microscopy for mapping subsurface features at varying depths. For the first time, we demonstrate experimentally that both the spatial resolution and depth contrast can be improved in subsurface microscopy by demodulating the measured near-field signal at higher harmonics of the probe's tapping frequency and by operating at smaller tapping amplitudes. Our findings are qualitatively supported by a simple dipole model.

Original languageEnglish (US)
Pages (from-to)593-600
Number of pages8
JournalOptics Express
Issue number1
StatePublished - Jan 2 2012

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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