Enhanced resolution in subsurface near-field optical microscopy

Roman Krutokhvostov; Alexander A. Govyadinov; Johannes M. Stiegler; Florian Huth; Andrey Chuvilin; P. Scott Carney; Rainer Hillenbrand

doi:10.1364/OE.20.000593

Enhanced resolution in subsurface near-field optical microscopy

Roman Krutokhvostov, Alexander A. Govyadinov, Johannes M. Stiegler, Florian Huth, Andrey Chuvilin, P. Scott Carney, Rainer Hillenbrand

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We report an experimental analysis of the capabilities of scattering-type scanning near-field optical microscopy for mapping subsurface features at varying depths. For the first time, we demonstrate experimentally that both the spatial resolution and depth contrast can be improved in subsurface microscopy by demodulating the measured near-field signal at higher harmonics of the probe's tapping frequency and by operating at smaller tapping amplitudes. Our findings are qualitatively supported by a simple dipole model.

Original language	English (US)
Pages (from-to)	593-600
Number of pages	8
Journal	Optics Express
Volume	20
Issue number	1
DOIs	https://doi.org/10.1364/OE.20.000593
State	Published - Jan 2 2012

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OE.20.000593

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AU - Chuvilin, Andrey

AU - Carney, P. Scott

AU - Hillenbrand, Rainer

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Enhanced resolution in subsurface near-field optical microscopy

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