Abstract
Metallic films with subwavelength apertures, integrated into a semiconductor by metal-assisted chemical etch (MacEtch), demonstrate enhanced transmission when compared to bare semiconductor surfaces. The resulting "buried" metallic structures are characterized spectroscopically and modeled using rigorous coupled wave analysis. These composite materials offer potential integration with optoelectronic devices, for simultaneous near-uniform electrical contact and strong optical coupling to free space.
Original language | English (US) |
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Pages (from-to) | 1441-1448 |
Number of pages | 8 |
Journal | Advanced Materials |
Volume | 28 |
Issue number | 7 |
DOIs | |
State | Published - Feb 17 2016 |
Keywords
- antireflection coatings
- optical transmission
- plasmonics
- semiconductors, metallic films
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering